The XIS-6545DV is an advanced X-Ray Inspection System (XIS) designed for dual-view x-ray screening. Its powerful dual generators provide upward and diagonal viewing angles of screened objects. Each view can be manipulated independently, allowing operators to perform rapid and in-depth inspections while simultaneously using different screening modes.
With Astrophysics best-in-class imaging software, the XIS-6545DV allows operators to inspect objects with colorful, high-contrast filters and identify materials, recognize objects, and isolate threats with increased speed and accuracy.
STANDARD FEATURES
6 Color Imaging
Color and Black/White Imaging
Geometric Image Distortion Correction
High Penetration Function
Organic/ Inorganic Imaging
Picture Perfect
Pseudo Color
Real- Time Image Manipulation
Atomic Z-Number Measurement
Material Discrimination
9 Quadrant Zoom
Continuous Scanning
Continuous Zoom up to 64x
Vertical Zoom Panning
Auto Image Archiving
Image Review
Image Annotation
JPEG Conversion
Print Image Capable
Multi-Tier Accessibility
Network Ready
Real-Time Self Diagnostic
Reverse Monochrome
Density Alert
Threat Image Projection (TIP)
Entry/ Exit Roller Tables